Engineer's Office for Applied Spectroscopy

 Home Site Map Brochures Contact German
 

FTM-Lite Thickness Gauges for USB 2.0


Our brand-new FTM-Lite film thickness gauges use the white-light interference phenomenon for film thickness determination. These instruments are designed especially for manually performed but even though high-precise measurements in the lab.

  •  Non-Contact and Non-Destructive Measurement

  •  Non-Radiation Optical Method using White Light

  •  Simultaneous Determination of Double-Layers possible

  •  Maintenance-free and handy desktop gauges for USB 2.0

  •  FTM-Lite NIR Thickness Range: 2 to 100 Microns ( 0.08 to 4 mil )

  •  FTM-Lite VIS Thickness Range: 1 to 25 Microns ( 0.04 to 1 mil )

FTM-Lite NIR Film Thickness Gauge for USB 2.0

FTM-Lite VIS Film Thickness Gauge for USB 2.0

FTM-Lite NIR film thickness gauge

Product information:  Product Information: FTM-Lite NIR Film Thickness Gauge for USB 2.0

FTM-Lite VIS film thickness gauge

Product information:  Product Information: FTM-Lite VIS Film Thickness Gauge for USB 2.0


The FTM-Lite film thickness gauges consists of a TranSpec Lite PDA-spectrometer (at bottom in the pictures), the HSL Lite halogen light source (at top in the pictures), a bifurcated fiber optics cable with probe holder and our FTM-ProVis Lite software package.

FTM-ProVis Lite Software   Product information: Product Information: FTM-ProVis Lite Software


For developing your own film thickness applications using our FTM-Lite film thickness gauges, we provide our powerful and very easy-to-use FTM-Lite++ programming library as DLL using standard-C calls.

FTM-Lite++ Programming Library   Product information: Product Information: FTM-Lite++ Programming Library


Up Next


Copyright © 2008 by Engineer's Office for Applied Spectroscopy, Germany
Edited last on January 08, 2008