Film Thickness Measurement

These pages (please select on the left side) explain our film thickness measurement technology using the white-light interference phenomenon. Our new FTM-Lite and the TranSpec-DSP thickness gauges distinguish from all others because of:

•  Non-Contact and Non-Destructive Measurement

•  Non-Radiation Optical Method using White Light

•  Fast Measurement and Evaluation - within Milliseconds!

•  Wide Thickness Range: 0.1 to 150 Microns ( 0.004 to 6 mil )

•  High Accuracy: typical better +/- 0.005 Microns

•  Simultaneous Determination of Double-Layers possible

•  Coordinate Controlled Measurement using x/y/z-Bridges possible

•  Convenient Software FTM-ProVis Lite and FTM-ProVis 2000

Typical applications are for instance:

- Transparent Lacquers on Metal or Plastics
- Non-Metal Layers from Vacuum Depositions
- Plastic Foils and other Wrapping Material