Engineer's Office for Applied Spectroscopy

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Film Thickness Measurement
of vapor deposition layers


The highly precise technology of our TranSpec-DSP thickness gauges determine the film thickness of even sub-micron layer structures, for instance, of Vapor Deposition Layers or Photo Resist Coatings.

The picture below shows a 3D film thickness profile of a 10 x 10 mm diamond layer on silicon in the thickness range of 0.8 to 1.0 microns. Each color maps a thickness range of only 0.0012 microns (= 12 nanometer). Note the microstructures on the plateau of the diamond layer!
 

3D Film Thickness Profile of a Diamond Layer on Silicon
 

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Copyright © 2008 by Engineer's Office for Applied Spectroscopy, Germany
Edited last on January 08, 2008